CHANDIGARH: PU Vice-Chancellor Prof. Renu Vig and Dr. Gurtej Singh Sandhu, Principal Fellow and Vice President at Micron Technology, inaugurated the latest high-end analytical instrument, the X-Ray Photoelectron Spectroscopy (XPS) system, at the Sophisticated Analytical Instrumentation Facility (SAIF), Panjab University. Dr. Sandhu has arrived to receive the Vigyan Ratna tomorrow.
This state-of-the-art equipment, worth Rs. 5 crores, has been procured through a generous grant from the Department of Science and Technology (DST), New Delhi, reinforcing SAIF’s commitment to advancing scientific research.
Prof. Gaurav Verma, Director of SAIF/CIL, along with several former Directors of SAIF, whose invaluable contributions have played a pivotal role in shaping the facility into a premier research hub, were also present on the occasion.
Dr. Sandhu, a distinguished figure in the semiconductor industry, holds an impressive 1, 382 U.S. utility patents, placing him among the top inventors globally. His pioneering work in thin-film processes and semiconductor device fabrication has significantly advanced memory chip technologies.
X-Ray Photoelectron Spectroscopy (XPS) is an indispensable tool in materials science, enabling precise analysis of surface chemistry, elemental composition, and chemical states. Its applications span diverse fields, including device fabrication, nanotechnology, environmental science, and advanced materials research.